Since the first transistors went into production almost six decades ago, semiconductor manufacturers have looked for ways to reduce test time and manufacturing costs. As the industry has grown from ...

Semiconductor manufacturers continue to look for ways to reduce the cost of test for producing mixed-signal SOC and SIP devices. Parallel test strategies, known as multisite test, implemented on ATE ...

International Test Conference- Santa Clara, CA – Business Wire – October 25th, 2007 — Intellitech Corporation, www.intellitech.com, the leader in lowering electronic product costs through IEEE ...

Teradyne at Productronica highlighted its new TestStation Duo concurrent in-circuit tester, which combines two complete and independent test modules inside a single tester frame to enable ...

Value stream management involves people in the organization to examine workflows and other processes to ensure they are deriving the maximum value from their efforts while eliminating waste — of ...