Longitudinal (top) and axial (middle) images of X-Ray CT data of parts with 6 internal defects: a spherical clog, a stellated shaped clog, a cone shaped void, a blob shaped void, an elliptical warp of ...

Tokyo, Japan – Scientists from Tokyo Metropolitan University have used machine learning to automate the identification of defects in sister chromatid cohesion. They trained a convolutional neural ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

Machine learning is a multibillion-dollar business with seemingly endless potential, but it poses some risks. Here's how to avoid the most common machine learning mistakes. Machine learning technology ...

Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...