Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
Veeco Instruments and research organisation imec have jointly developed a manufacturing process that enables the integration ...
TAIPEI, Taiwan--(BUSINESS WIRE)--TrendForce reports that the three largest DRAM suppliers are increasing wafer input for advanced processes. Following a rise in memory contract prices, companies have ...
Hongyuan Green Energy says it has produced a first batch of 40 µm monocrystalline silicon wafers that support full-size and half-cut formats, with slicing completed using the company’s in-house ...
Flexibility: Applied’s most significant new platform in more than a decade hosts an unprecedented wide variety of chamber types, sizes and configurations, from Applied and partners Intelligence: ...
Key opportunities include the rise in high-performance computing & automotive applications, the expansion driven by 5G ...
Asymmetries in wafer map defects are usually treated as random production hardware defects. For example, asymmetric wafer defects can be caused by particles inadvertently deposited on a wafer during ...
NexWafe’s continuous, direct gas-to-wafer manufacturing process also minimizes waste, resulting in wafers that are less expensive than conventional wafers. NexWafe’s in-line, ultra-scalable process ...
BAY CITY, Mich. (AP) — The U.S. Department of Energy announced a conditional $544 million loan Thursday that would allow a Michigan semiconductor manufacturing plant to expand to make parts that can ...
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