Yahoo Finance

Aehr Test Systems Secures Initial $10 Million in Orders for Production Wafer-Level Burn-In of Advanced AI Processors

Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced a significant milestone with the receipt of its first artificial intelligence (AI) ...
Yahoo Finance

Aehr Test Systems Announces Wafer Level Burn-in and Test Application Evaluation Order from Leading AI Processor Supplier

FREMONT, CA / ACCESS Newswire / August 26, 2025 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received a purchase order ...
Nasdaq

Teradyne Announces Production System for Double-Sided Wafer Probe Test for Silicon Photonics

NORTH READING, Mass.--(BUSINESS WIRE)-- Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, ...
Electronic Design

Testing MEMS at Wafer Level

Although it requires a new generation of test equipment, testing MEMS devices is challenging but not impossible. Since the early days of the IC industry, wafer-level test has been possible using ...
Nasdaq

Aehr Receives First Order for FOX(TM) Wafer Level Test and Burn-in System to be used for Gallium Nitride Semiconductor Engineering and Qualification

FREMONT, CA / ACCESSWIRE / December 14, 2023 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer ...
Business Wire

Hprobe Announces New Generation of Magnetic Test Head for Wafer Sort of MRAM in Mass Production

GRENOBLE, France--(BUSINESS WIRE)--Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced a breakthrough magnetic test head revolutionizing ...
EDN

Getting 1000x test compression during wafer test

Embedded test compression is a standard technique for dramatically reducing the test data volume and test time on the automatic test equipment. Companies typically aim for 60x to 100x compression for ...
Business Wire

Keysight Unveils 3kV High Voltage Wafer Test System for Power Semiconductors

Increased productivity and efficiency with one-pass test enabled by a high-voltage switching matrix Designed to enhance the safety of operators and equipment; complies with regulations SANTA ROSA, ...
Semiconductor Engineering

Engineering Challenges Grow With Crystalline Defects

Wafer breakage is the most serious impact of killer crystalline defects. About 0.1 to 0.2% of silicon wafers break. The higher the number of wafer breakages, the slower the time to market. Given the ...
EDN

Contactless Testing Wafer Testing

STMicroelectronics, a global semiconductor leader serving customers across the spectrum of electronics applications, announced the successful production of the world’s first semiconductor wafer whose ...
Semiconductor Engineering

Using Fab Sensors To Reduce Auto Defects

The semiconductor manufacturing ecosystem has begun collaborating on ways to effectively use wafer data to meet the stringent quality and reliability requirements for automotive ICs. Silicon ...